Fundamentals of nanoscale film analysis /

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Bibliographic Details
Main Authors:	Alford, Terry L. (Author), Feldman, Leonard C. (Author), Mayer, James W., 1930 (Author)
Format:	Book
Language:	English
Published:	New York, N.Y. ; London : Springer, 2007
Subjects:	Nanostructured materials Thin films
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